The SMS laboratory is equipped with the following microscopy apparatus (click on the link for a direct access to the relevant section):
Supplier: Nikon et Linkam
Principle: Optical microscopy observation down to x500 magnification. The microscope can be set to reflextion or transmission mode and is equiped with a polarizer (that permits crossed polarized light observations). We also possess a hot stage device allowing to regulate sample temperature (from -150 to 800 °C). A CCD camera allows to record photos or films of the observed events.
Type of analysis performed: Microscopy observations. Study of crystal morphologies, of the presence of crystal defects or of the state of agglomeration of crytalline powders. The use of the hot-stage allows to monitor the samples as a function of temperature and to detect phase transitions (recrystallization, desolvation, polymorphic transitions, fusions...).
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Supplier: Hirox
Principle: High resolution optical digital microscope (magnification x7000). 3D Digital reconstruction of sample starting from multifocal pictures.
Type of analyses performed: Various microscopy observations.
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Supplier: Jeol
Principle: Observations by Scanning Electron Microscopy (magnifications from x30 up to x20000). The observations can be performed either by secondary electron mode or by back-scattering electron mode (three acceleration voltages available: 5, 10 or 15 kV). The sample analyzed may undergo a preliminary step of gold coating (few nanometers) by using a Jeol NeoCoater MP-19020NCTR metalizing unit.
Type of analyses performed: Various microscopic observations: morphological profile of crystalline powders, visualization of surface roughness and quality of the crystals, Particle Size Distribution evaluation.
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